Semiconductor Device Test Set NSN 6625-01-481-1988

Feat

Items are being coded as critical to insure source inspection will be performed at the point of manufacture, prior to material receipt by the us navy or other dod components. These items are piece parts or end items in support of vital military hardware necessary to sustain the successful mission of the ships, submarines, and shore stations of the us navy. Critical features including, but not limited to, dimensions, tolerances/clearances, electronic characteristics, and metallurgical properties will bespecified for government q ar (quality assurance representatives) to insure the highest possible degree of quality and reliability of these parts being delivered under navicp contracts

6625 Electrical And Electronic Properties Measuring And Testing Instruments

014811988

6625014811988